Jiun‐Jye Chang

Behaviors of InGaZnO thin film transistor under illuminated positive gate-bias stress

Te-Chih Chen, Ting‐Chang Chang, Chih-Tsung Tsai et al. · Applied Physics Letters · 2010 · 184 citations

Engineering, Electrical Engineering, Materials Science +17

Influence of positive bias stress on N2O plasma improved InGaZnO thin film transistor

Chih-Tsung Tsai, Ting‐Chang Chang, Shih-Ching Chen et al. · Applied Physics Letters · 2010 · 171 citations

Engineering, Electrical Engineering, Materials Science +17

Light-induced instability of an InGaZnO thin film transistor with and without SiOx passivation layer formed by plasma-enhanced-chemical-vapor-deposition

Te-Chih Chen, Ting‐Chang Chang, Tien‐Yu Hsieh et al. · Applied Physics Letters · 2010 · 106 citations

Engineering, Materials Engineering, Materials Science +17

Twin Thin-Film Transistor Nonvolatile Memory With an Indium–Gallium–Zinc–Oxide Floating Gate

Min-Feng Hung, Yung‐Chun Wu, Jiun‐Jye Chang et al. · IEEE Electron Device Letters · 2012 · 39 citations

Engineering, Electrical Engineering, Materials Science +17