N. Tam

Timing Vulnerability Factors of Sequentials

N. Seifert, N. Tam · IEEE Transactions on Device and Materials Reliability · 2004 · 120 citations

Engineering, Computer Engineering, Computer Science +14

Multi-Cell Soft Errors at Advanced Technology Nodes

B. L. Bhuva, N. Tam, L. W. Massengill et al. · IEEE Transactions on Nuclear Science · 2015 · 47 citations

Engineering, Computer Engineering, Electrical Engineering +17

An efficient volume-removal algorithm for practical three-dimensional lithography simulation with experimental verification

E.W. Scheckler, N. Tam, Anton K. Pfau et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 1993 · 31 citations

Engineering, Materials Engineering, Materials Science +14

Multi-cell soft errors at the 16-nm FinFET technology node

N. Tam, B. L. Bhuva, L. W. Massengill et al. · 2015 · 24 citations · Full text

Engineering, Computer Engineering, Electrical Engineering +16

Terrestrial SER characterization for nanoscale technologies: A comparative study

N. N. Mahatme, B. L. Bhuva, N. J. Gaspard et al. · 2015 · 15 citations

Engineering, Computer Engineering, Electrical Engineering +17