Tiao−Yuan Huang

Hot-electron-induced punchthrough (HEIP) effect in submicrometer PMOSFET's

Mitsumasa Koyanagi, A.G. Lewis, Richard J. Martin et al. · IEEE Transactions on Electron Devices · 1987 · 134 citations

Electrical Engineering, Engineering, Hardware Reliability +11

Novel poly-silicon nanowire field effect transistor for biosensing application

Cheng-Yun Hsiao, Chih-Heng Lin, Cheng-Hsiung Hung et al. · Biosensors and Bioelectronics · 2008 · 108 citations

Engineering, Biosensing Systems, Nanotechnology +5

Ultrasensitive detection of dopamine using a polysilicon nanowire field-effect transistor

Chih-Heng Lin, Cheng-Yun Hsiao, Chen‐Hsiung Hung et al. · Chemical Communications · 2008 · 75 citations

Poly-crystalline Silicon, Nanosensors, Electrical Engineering +15

Characteristics of n-Type Junctionless Poly-Si Thin-Film Transistors With an Ultrathin Channel

Horng‐Chih Lin, Cheng-I Lin, Tiao−Yuan Huang · IEEE Electron Device Letters · 2011 · 73 citations

Semiconductors, Semiconductor Technology, Electrical Engineering +13

Latchup performance of retrograde and conventional n-well CMOS technologies

A.G. Lewis, Richard J. Martin, Tiao−Yuan Huang et al. · IEEE Transactions on Electron Devices · 1987 · 49 citations

Low-power Electronics, Electrical Engineering, Engineering +13