Tiao−Yuan Huang - Concepedia

Author

Tiao−Yuan Huang

National Yang Ming Chiao Tung University

Also Known As

Tiao-Yuan Huang, Tiao-Yuan Huang Tiao-Yuan Huang, Tiao‐Yuan Huang, Tiao−Yuan Huang

171

Publications

1.4K

Citations

H-Index

Concepts

All Affiliations

National Yang Ming Chiao Tung University National Institutes of Applied Research Palo Alto Research Center National Tsing Hua University National Dong Hwa University

About

Tiao−Yuan Huang is an author at National Yang Ming Chiao Tung University specializing in electrical engineering, engineering, and applied physics.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	17	45	1.1K
2	Applied Physics	16	39	738
3	Computer Engineering	8	8	273
4	Biomedical Engineering	2	2	183
5	Chemical Engineering	1	1	11

Tiao−Yuan Huang

Publications

1.1K

Citations

H-Index

Page 1

	Year	Citations
Hot-electron-induced punchthrough (HEIP) effect in submicrometer PMOSFET's Mitsumasa Koyanagi, A.G. Lewis, Richard J. Martin, IEEE Transactions on Electron Devices Electrical EngineeringEngineeringHardware ReliabilityPhysicsElectron Spectroscopy	1987	134
Novel poly-silicon nanowire field effect transistor for biosensing application Cheng-Yun Hsiao, Chih-Heng Lin, Cheng-Hsiung Hung, Biosensors and Bioelectronics EngineeringBiosensing SystemsNanotechnologyBioelectronicsSensor Design	2008	108
Ultrasensitive detection of dopamine using a polysilicon nanowire field-effect transistor Chih-Heng Lin, Cheng-Yun Hsiao, Chen‐Hsiung Hung, Chemical Communications Poly-crystalline SiliconNanosensorsElectrical EngineeringEngineeringNanotechnology	2008	75
Characteristics of n-Type Junctionless Poly-Si Thin-Film Transistors With an Ultrathin Channel Horng‐Chih Lin, Cheng-I Lin, Tiao−Yuan Huang IEEE Electron Device Letters SemiconductorsSemiconductor TechnologyElectrical EngineeringElectronic DevicesJl Poly-si Tfts	2011	73
Latchup performance of retrograde and conventional n-well CMOS technologies A.G. Lewis, Richard J. Martin, Tiao−Yuan Huang, IEEE Transactions on Electron Devices Low-power ElectronicsElectrical EngineeringEngineeringVlsi DesignCircuit System	1987	49
The characteristics of hole trapping in HfO2∕SiO2 gate dielectrics with TiN gate electrode Wen-Tai Lu, Po-Ching Lin, Tiao−Yuan Huang, Applied Physics Letters EngineeringDominant Hole TrappingCharge TransportSemiconductor DeviceNanoelectronics	2004	39
Study on Ge/Si ratio, silicidation, and strain relaxation of high temperature sputtered Co/Si1−xGex structures Hsiang-Jen Huang, Kun‐Ming Chen, Chun-Yen Chang, Journal of Applied Physics EngineeringSilicon On InsulatorGe/si RatioHigh-temperature-sputtered Co/si1−xgex JunctionSemiconductor Nanostructures	2000	33
A new LDD transistor with inverse-T gate structure Tiao−Yuan Huang, Wei Yao, Richard J. Martin, IEEE Electron Device Letters Electrical EngineeringEngineeringVlsi DesignNanoelectronicsElectronic Engineering	1987	32
Evaluation of plasma charging damage in ultrathin gate oxides Horng‐Chih Lin, Chi‐Chun Chen, Chao-Hsing Chien, IEEE Electron Device Letters Ultrathin OxidesElectrical EngineeringUltrathin Gate OxidesEngineeringPhysics	1998	31
High-performance Pt/SrBi/sub 2/Ta/sub 2/O/sub 9//HfO/sub 2//Si structure for nondestructive readout memory Chao‐Hsin Chien, Ding-Yeong Wang, Ming-Jui Yang, IEEE Electron Device Letters Non-volatile MemoryEngineeringEmerging Memory TechnologyPhase Change MemoryFerroelectric Application	2003	24

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