Helmut Wolff

A metrological large range atomic force microscope with improved performance

Gaoliang Dai, Helmut Wolff, Frank Pohlenz et al. · Review of Scientific Instruments · 2009 · 64 citations

Engineering, Microscopy, Measurement +22

Atomic force probe for sidewall scanning of nano- and microstructures

Gaoliang Dai, Helmut Wolff, Frank Pohlenz et al. · Applied Physics Letters · 2006 · 59 citations

Engineering, Afm Tip, Microscopy +20

Development of a 3D-AFM for true 3D measurements of nanostructures

Gaoliang Dai, Wolfgang Häßler‐Grohne, Dorothee Hüser et al. · Measurement Science and Technology · 2011 · 47 citations

Engineering, Afm Tip, Microscopy +20

Nanoscale surface measurements at sidewalls of nano- and micro-structures

Gaoliang Dai, Helmut Wolff, Thomas Weimann et al. · Measurement Science and Technology · 2007 · 46 citations

Engineering, Microscopy, Nanostructured Surface +19

An atomic force microscope for the study of the effects of tip–sample interactions on dimensional metrology

Andrew Yacoot, Ludger Koenders, Helmut Wolff · Measurement Science and Technology · 2007 · 41 citations

Engineering, Afm Tip, Microscopy +19