Dorothee Hüser

Silicon microcavity arrays with open access and a finesse of half a million

Georg Wachter, Stefan Kühn, Stefan Minniberger et al. · Light Science & Applications · 2019 · 68 citations · Full text

Engineering, Materials Engineering, Materials Science +17

Development of a 3D-AFM for true 3D measurements of nanostructures

Gaoliang Dai, Wolfgang Häßler‐Grohne, Dorothee Hüser et al. · Measurement Science and Technology · 2011 · 49 citations

Engineering, Mechanical Engineering, Microelectromechanical Systems +15

Current limitations of SEM and AFM metrology for the characterization of 3D nanostructures

Wolfgang Häßler‐Grohne, Dorothee Hüser, Klaus‐Peter Johnsen et al. · Measurement Science and Technology · 2011 · 36 citations

Natural Sciences, Materials Science, Nanomaterials +16

Crossing-The-Line Segmentation as a Basis for Rsm and Rc Evaluation

J Seewig, Paul J. Scott, Matthias Eifler et al. · Surface Topography Metrology and Properties · 2020 · 26 citations · Full text

Engineering, Computer Science, Feature Engineering +6

Intercomparison of scanning probe microscopes

R Breil, Th. Fries, J Haycocks et al. · Precision Engineering · 2002 · 22 citations

Natural Sciences, Biomedical Engineering, Instrumentation +6