T.A. Hill

SEU-sensitive volumes in bulk and SOI SRAMs from first-principles calculations and experiments

P.E. Dodd, A.R. Shaneyfelt, K.M. Horn et al. · IEEE Transactions on Nuclear Science · 2001 · 186 citations

Engineering, Computer Engineering, Electrical Engineering +17

Single-chip precision oscillators based on multi-frequency, high-Q aluminum nitride MEMS resonators

K.E. Wojciechowski, Roy H. Olsson, Melanie R. Tuck et al. · TRANSDUCERS 2009 - 2009 International Solid-State Sensors, Actuators and Microsystems Conference · 2009 · 56 citations

Engineering, Electrical Engineering, Microelectromechanical Systems +16

Charge collection in SOI capacitors and circuits and its effect on SEU hardness

J.R. Schwank, P.E. Dodd, M.R. Shaneyfelt et al. · IEEE Transactions on Nuclear Science · 2002 · 54 citations

Engineering, Computer Engineering, Electrical Engineering +17

Microstructural Properties of Helium Implanted Void Layers in Silicon as Related to Front‐Side Gettering

J.W. Medernach, T.A. Hill, S. M. Myers et al. · Journal of The Electrochemical Society · 1996 · 16 citations

Natural Sciences, Materials Engineering, Materials Science +15