Sing Pin Tay

<i>In situ</i> real-time studies of nickel silicide phase formation

M. Tinani, A. H. Mueller, Yan-Hong Gao et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 2001 · 72 citations

Natural Sciences, Materials Engineering, Materials Science +17

Leakage current comparison between ultra-thin Ta₂O₅ films and conventional gate dielectrics

Qiang Lu, Donggun Park, A. Kalnitsky et al. · IEEE Electron Device Letters · 1998 · 72 citations

Engineering, Electrical Engineering, Materials Science +17

Molecular relaxation processes of some halonaphthalenes in a polystyrene matrix

Sing Pin Tay, S. Walker · The Journal of Chemical Physics · 1975 · 35 citations

Natural Sciences, Chemistry, Physics +15

Spectroscopic ellipsometry investigation of nickel silicide formation by rapid thermal process

Yao-Zhi Hu, Sing Pin Tay · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 1998 · 31 citations

Engineering, Materials Engineering, Materials Science +15

Comparison of energy barrier data from dielectric, n. m. r. and ultrasonic techniques

Sing Pin Tay, S. Walker, E. Wyn‐Jones · Advances in Molecular Relaxation and Interaction Processes · 1978 · 22 citations

Natural Sciences, Materials Science, Ultrasound +8