A. H. Mueller

Structural and Photoelectrochemical Properties of BiVO₄ Thin Films

Hongmei Luo, A. H. Mueller, T. Mark McCleskey et al. · The Journal of Physical Chemistry C · 2008 · 163 citations

Natural Sciences, Chemistry, Materials Science +16

Optical band gap of NpO2 and PuO2 from optical absorbance of epitaxial films

T. Mark McCleskey, Eve Bauer, Q. X. Jia et al. · Journal of Applied Physics · 2013 · 84 citations

Natural Sciences, Materials Science, Physics +17

<i>In situ</i> real-time studies of nickel silicide phase formation

M. Tinani, A. H. Mueller, Yan-Hong Gao et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 2001 · 72 citations

Natural Sciences, Materials Engineering, Materials Science +17

ILC Reference Design Report: ILC Global Design Effort and World Wide Study

J. E. Brau, T. Mimashi, Jin‐Young Jung et al. · (2007) · 2007 · 36 citations

Arts, Design, Design Optimization +4

<i>In situ</i> study of interface reactions of ion beam sputter deposited (Ba0.5Sr0.5)TiO3 films on Si, SiO2, and Ir

Yan-Hong Gao, A. H. Mueller, E. A. Irene et al. · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 1999 · 36 citations

Natural Sciences, Materials Engineering, Materials Science +17