Z. Luo

Vertically scaled MOSFET gate stacks and junctions: How far are we likely to go?

C. M. Osburn, I. Kim, Suyong Han et al. · IBM Journal of Research and Development · 2002 · 35 citations

Engineering, Vlsi Design, Dielectric Scaling +16

Temperature dependence of gate currents in thin Ta2O5 and TiO2 films

Z. Luo, Xin Guo, T. P. et al. · Applied Physics Letters · 2001 · 33 citations

Materials Science, Engineering, Stress-induced Leakage Current +9

Thermally robust dual-work function ALD-MN/sub x/ MOSFETs using conventional CMOS process flow

D.-G. Park, Z. Luo, N.L. Edleman et al. · 2004 · 24 citations

Low-power Electronics, Gate Structure, Electrical Engineering +12

High-temperature characteristics of high-quality SiC MIS capacitors with O/N/O gate dielectric

X.W. Wang, Z. Luo, Tso‐Ping Ma · IEEE Transactions on Electron Devices · 2000 · 23 citations

Materials Engineering, Ono Stack Gate, Electrical Engineering +12

Design of high performance PFETs with strained si channel and laser anneal

Z. Luo, Y. F. Chong, J. Kim et al. · 2006 · 23 citations

Wide-bandgap Semiconductor, Engineering, Laser Anneal +16