T. Onai

Analytical quantum mechanical model for accumulation capacitance of MOS structures

Shinichi Saito, Kazuyoshi Torii, Masahiko Hiratani et al. · IEEE Electron Device Letters · 2002 · 88 citations

Device Modeling, Electrical Engineering, Engineering +12

Negative bias temperature instability of pMOSFETs with ultra-thin SiON gate dielectrics

Shigeo Tsujikawa, Toshiyuki Mine, Kenji Watanabe et al. · 2003 · 75 citations

Electrical Engineering, Engineering, Physics +10

Remote-charge-scattering limited mobility in field-effect transistors with SiO2 and Al2O3∕SiO2 gate stacks

Shinichi Saito, Kazuyoshi Torii, Yasuhiro Shimamoto et al. · Journal of Applied Physics · 2005 · 69 citations

Electrical Engineering, Engineering, Remote-charge-scattering Limited Mobility +14

130-GHz f/sub T/ SiGe HBT technology

Katsuya Oda, E. Ohue, M. Tanabe et al. · 2002 · 65 citations

Electrical Engineering, Record Cutoff Frequency, Engineering +13

Electro-Luminescence from Ultra-Thin Silicon

Shinichi Saito, Digh Hisamoto, Haruka Shimizu et al. · Japanese Journal of Applied Physics · 2006 · 59 citations

Two-dimensional Quantum, Electrical Engineering, Photoluminescence +13