Toshiyuki Mine

Single-electron memory for giga-to-tera bit storage

Kazuo Yano, T. Ishii, T. Sano et al. · Proceedings of the IEEE · 1999 · 176 citations

Engineering, Electrical Engineering, Materials Science +16

Impact of threshold voltage fluctuation due to random telegraph noise on scaled-down SRAM

Naoki Tega, Hiroshi Miki, Masanao Yamaoka et al. · 2008 · 90 citations

Engineering, Computer Engineering, Electrical Engineering +17

Negative bias temperature instability of pMOSFETs with ultra-thin SiON gate dielectrics

Shigeo Tsujikawa, Toshiyuki Mine, Kenji Watanabe et al. · 2003 · 76 citations

Natural Sciences, Electrical Engineering, Physics +17

Optical anisotropy in wire-geometry SiGe layers grown by gas-source selective epitaxial growth technique

Noritaka Usami, Toshiyuki Mine, S. Fukatsu et al. · Applied Physics Letters · 1994 · 66 citations

Natural Sciences, Materials Engineering, Materials Science +16

Electro-Luminescence from Ultra-Thin Silicon

Digh Hisamoto, Haruka Shimizu, Hirotaka Hamamura et al. · Japanese Journal of Applied Physics · 2006 · 59 citations

Engineering, Electrical Engineering, Materials Science +15