Concepedia

M. S. Joo

MS

6

Publications

429

Citations

6

H-Index

2002

Active since

Affiliations

National University of Singapore(Current)

Institute of Microelectronics

The University of Texas at Austin

Korea University

M. S. Joo is an author at National University of Singapore specializing in engineering, applied physics, and microelectronics.

Top concepts

EngineeringApplied PhysicsMicroelectronicsPhysicsElectrical EngineeringNanoelectronicsMaterial ScienceSemiconductorsChemistryHeat Transfer

Publications per year

2002–2008

6

Publications

6

Energy gap and band alignment for (HfO2)x(Al2O3)1−x on (100) Si

H.Y. Yu, Meng Li, B. J. Cho et al. · Applied Physics Letters · 2002 · 314 citations

Si Substrate, Engineering, Chemistry +16

Thermal Instability of Effective Work Function in Metal/High-&lt;tex&gt;$kappa$&lt;/tex&gt;Stack and Its Material Dependence

M. S. Joo, B.J. Cho, N. Balasubramanian et al. · IEEE Electron Device Letters · 2004 · 36 citations

Engineering, Material Dependence, Gate Dielectric +22

Analysis of electronic memory traps in the oxide-nitride-oxide structure of a polysilicon-oxide-nitride-oxide-semiconductor flash memory

Yujeong Seo, K. C. Kim, T. G. Kim et al. · Applied Physics Letters · 2008 · 28 citations

Non-volatile Memory, Engineering, Electron Memory Trap +20

Correlation between charge trap distribution and memory characteristics in metal/oxide/nitride/oxide/silicon devices with two different blocking oxides, Al2O3 and SiO2

Yujeong Seo, K. C. Kim, H. D. Kim et al. · Applied Physics Letters · 2008 · 21 citations

Non-volatile Memory, Electrical Engineering, Engineering +14

Charge Trapping and Breakdown Mechanism in HfAlO/TaN Gate Stack Analyzed Using Carrier Separation

Wei Yip Loh, B.J. Cho, M. S. Joo et al. · IEEE Transactions on Device and Materials Reliability · 2004 · 18 citations

Electrical Engineering, Charge Trapping, Engineering +11

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