Concepedia
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Publications
2
Citations
49
H-Index
Active since
2008
Affiliations
SK Group (Japan)(Current)
SK Group (United States)
Korea University
K. C. Kim is an author at SK Group (Japan) specializing in electronic materials, device characterization, and interface trap density.
Publications per year
2008–2008
Analysis of electronic memory traps in the oxide-nitride-oxide structure of a polysilicon-oxide-nitride-oxide-semiconductor flash memory
Yujeong Seo, K. C. Kim, T. G. Kim et al. · Applied Physics Letters · 2008 · 28 citations
Engineering, Materials Engineering, Materials Science +17
Correlation between charge trap distribution and memory characteristics in metal/oxide/nitride/oxide/silicon devices with two different blocking oxides, Al2O3 and SiO2
Yujeong Seo, K. C. Kim, H. D. Kim et al. · Applied Physics Letters · 2008 · 21 citations
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