B.J. Cho

Over-Erase Phenomenon in SONOS-Type Flash Memory and its Minimization Using a Hafnium Oxide Charge Storage Layer

Y.-N. Tan, W. K. Chim, B.J. Cho et al. · IEEE Transactions on Electron Devices · 2004 · 123 citations

Materials Science, Materials Engineering, Electrical Engineering +15

Annealing and oxidation of silicon oxide films prepared by plasma-enhanced chemical vapor deposition

X.Y. Chen, Yu Lu, L.J. Tang et al. · Journal of Applied Physics · 2004 · 113 citations

Engineering, Si Oxide, Optoelectronic Devices +18

<tex>$hbox Al_2hbox O_3$</tex>–Ge-On-Insulator n- and p-MOSFETs With Fully NiSi and NiGe Dual Gates

Decai Yu, Ching-Ying Huang, Albert Chin et al. · IEEE Electron Device Letters · 2004 · 55 citations

Materials Engineering, Materials Science, Electrical Engineering +11

Electron mobility enhancement using ultrathin pure Ge on Si substrate

Chia Ching Yeo, B.J. Cho, Fei Gao et al. · IEEE Electron Device Letters · 2005 · 55 citations

Materials Science, Electrical Engineering, Bulk Si Devices +13

Evidence and Understanding of ALD<tex>$hbox HfO_2hbox --hbox Al_2hbox O_3$</tex>Laminate MIM Capacitors Outperforming Sandwich Counterparts

Shi‐Jin Ding, Hang Hu, Chunxiang Zhu et al. · IEEE Electron Device Letters · 2004 · 38 citations

Materials Science, Electrical Engineering, Dielectrics +10