C.H. Ling

Carrier mobility and field effect in thin indium antimode films

C.H. Ling, J.H. Fisher, J.C. Anderson · Thin Solid Films · 1972 · 56 citations

Engineering, Physics, Carrier Mobility +5

A unified model for the self-limiting hot-carrier degradation in LDD n-MOSFETs

D. S. Ang, C.H. Ling · IEEE Transactions on Electron Devices · 1998 · 48 citations

Device Modeling, Electrical Engineering, Engineering +13

Observation of MOSFET degradation due to electrical stressing through gate-to-source and gate-to-drain capacitance measurement

Y.T. Yeow, C.H. Ling, L.K. Ah · IEEE Electron Device Letters · 1991 · 47 citations

Device Modeling, Electrical Engineering, Engineering +13

Structural and electrical studies of radio frequency sputtered hydrogenated amorphous silicon carbide films

Won Kook Choi, F. L. Loo, C.H. Ling et al. · Journal of Applied Physics · 1995 · 43 citations

Electrical Studies, Engineering, Radio Frequency +18

Evidence of two distinct degradation mechanisms from temperature dependence of negative bias stressing of the ultrathin gate p-MOSFET

D. S. Ang, S. Wang, C.H. Ling · IEEE Electron Device Letters · 2005 · 43 citations

Electrical Engineering, Engineering, Physics +14