Concepedia

L.K. Ah

LA

4

Publications

101

Citations

4

H-Index

1991

Active since

Affiliations

National University of Singapore(Current)

The University of Queensland

L.K. Ah is an author at National University of Singapore specializing in engineering, electrical engineering, and device modeling.

Top concepts

Publications per year

1991–1995

4

Publications

4

Observation of MOSFET degradation due to electrical stressing through gate-to-source and gate-to-drain capacitance measurement

Y.T. Yeow, C.H. Ling, L.K. Ah · IEEE Electron Device Letters · 1991 · 47 citations

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Study of rf-sputtered yttrium oxide films on silicon by capacitance measurements

C.H. Ling, J. Bhaskaran, W. K. Choi et al. · Journal of Applied Physics · 1995 · 21 citations

, , +13

Characterization of charge trapping in submicrometer NMOSFET's by gate capacitance measurements

C.H. Ling, Y.T. Yeow, L.K. Ah · IEEE Electron Device Letters · 1992 · 21 citations

, , +18

Logarithmic time dependence of <i>p</i> MOSFET degradation observed from gate capacitance

C.H. Ling, Y.T. Yeow, L.K. Ah et al. · Electronics Letters · 1993 · 12 citations

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