Y.T. Yeow - Concepedia

Author

Y.T. Yeow

The University of Queensland

Also Known As

Y T Yeow, Y-T. Yeow, Y. -T. Yeow, Y. T. YEOW, Y. T. Yeow, Y. Yeow, Y.-T. YEOW, Y.T Yeow, Y.T. Yeow, YT Yeow

Publications

927

Citations

H-Index

Concepts

All Affiliations

The University of Queensland Virginia Tech National University of Singapore Griffith University Cypress Semiconductor Corporation (United States)

About

Y.T. Yeow is an author at The University of Queensland specializing in engineering, electrical engineering, and materials science.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	19	25	712
2	Electrical Engineering	12	15	472
3	Applied Physics	11	13	399
4	Civil Engineering	2	2	73
5	Chemical Engineering	1	1	11

Y.T. Yeow

Publications

734

Citations

H-Index

Page 1

	Year	Citations
High quality ultrathin dielectric films grown on silicon in a nitric oxide ambient Zhigang Yao, H.B. Harrison, Sima Dimitrijev, Applied Physics Letters Materials ScienceMaterials EngineeringElectrical EngineeringEngineeringNanoelectronics	1994	79
Observation of MOSFET degradation due to electrical stressing through gate-to-source and gate-to-drain capacitance measurement Y.T. Yeow, C.H. Ling, L.K. Ah IEEE Electron Device Letters Device ModelingElectrical EngineeringEngineeringStress-induced Leakage CurrentElectronic Engineering	1991	47
An investigation of the influence of low-temperature annealing treatments on the interface state density at the Si-SiO<sub>2</sub> Y.T. Yeow, D. R. Lamb, S. D. Brotherton Journal of Physics D Applied Physics Materials ScienceSemiconductor TechnologyElectrical EngineeringQuasistatic Capacitance-voltage MeasurementsEngineering	1975	46
Effects of nitric oxide annealing of thermally grown silicon dioxide characteristics Zhigang Yao, H.B. Harrison, Sima Dimitrijev, IEEE Electron Device Letters EngineeringNitric OxideOptoelectronic DevicesThin Film Process TechnologySilicon On Insulator	1995	46
A comparison of simple shear characterization methods for composite laminates Y.T. Yeow, H. F. Brinson Composites Fibre-reinforced PlasticCompositesEngineeringMechanical EngineeringCivil Engineering	1978	43
The electrical properties of sub-5-nm oxynitride dielectrics prepared in a nitric oxide ambient using rapid thermal processing Zhigang Yao, H.B. Harrison, Sima Dimitrijev, IEEE Electron Device Letters EngineeringNitric OxideOptoelectronic DevicesThin Film Process TechnologyElectrical Properties	1994	41
Voltage shifts of Fowler-Nordheim tunneling J-V plots in thin gate oxide MOS structures due to trapped charges Seog-Ju Oh, Y.T. Yeow Solid-State Electronics Electrical EngineeringVoltage ShiftsEngineeringPhysicsTunneling Microscopy	1989	37
Creation and termination of substrate deep depletion in thin oxide MOS Capacitors by charge tunneling M.S. Liang, Chih-Yao Chang, Y.T. Yeow, IEEE Electron Device Letters Materials ScienceElectrical EngineeringEngineeringPhysicsDeep Depletion	1983	36
Extraction of MOSFET threshold voltage, series resistance, effective channel length, and inversion layer mobility from small-signal channel conductance measurement F. Kong, Y.T. Yeow, Z.Q. Yao IEEE Transactions on Electron Devices Device ModelingLow-power ElectronicsElectrical EngineeringSemiconductor DeviceEngineering	2001	31
A Correlative Study Between Analysis and Experiment on the Fracture Behavior of Graphite/Epoxy Composites Y.T. Yeow, D. H. Morris, H. F. Brinson Journal of Testing and Evaluation Materials ScienceExperimental ResultsDamage MechanismEngineeringFiber-reinforced Composite	1979	30

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