Concepedia

Izumi Hirano

IH

Statistics

Publications

3

Citations

39

H-Index

3

Active since

2006

Affiliations

Toshiba (Japan)(Current)

Izumi Hirano is an author at Toshiba (Japan) specializing in electrical engineering, microelectronics, and electrical insulation.

Top concepts

EngineeringMicroelectronicsElectrical InsulationElectrical EngineeringPhysicsApplied PhysicsNanoelectronicsDevice ModelingElectrochemistryElectronic Engineering

Publications per year

2006–2013

3

Publications

3

Effects of Nitrogen Concentration and Post-treatment on Reliability of HfSiON Gate Dielectrics in Inversion States

Motoyuki Sato, Tomonori Aoyama, Katsuyuki Sekine et al. · Japanese Journal of Applied Physics · 2006 · 14 citations

Nitrogen Concentration, Silc Behavior, Electrical Engineering +15

Impact of metal gate electrode on Weibull distribution of TDDB in HfSiON gate dielectrics

Izumi Hirano, Yasushi Nakasaki, Shigeto Fukatsu et al. · 2009 · 13 citations

Wide-bandgap Semiconductor, Engineering, Dc Stress +18

Time-dependent dielectric breakdown (TDDB) distribution in n-MOSFET with HfSiON gate dielectrics under DC and AC stressing

Izumi Hirano, Yasushi Nakasaki, Shigeto Fukatsu et al. · Microelectronics Reliability · 2013 · 12 citations

Electrical Engineering, Engineering, Stress-induced Leakage Current +7

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