B. J. O’Sullivan

Ubiquitous relaxation in BTI stressing—New evaluation and insights

B. Kaczer, Tibor Grasser, Jean-Marc Roussel et al. · 2008 · 249 citations

Engineering, Electrical Engineering, Materials Science +17

Nanocrystalline TiO2 films studied by optical, XRD and FTIR spectroscopy

Junying Zhang, Ian W. Boyd, B. J. O’Sullivan et al. · Journal of Non-Crystalline Solids · 2002 · 201 citations

Natural Sciences, Materials Engineering, Materials Science +14

Si (100)– SiO 2 interface properties following rapid thermal processing

B. J. O’Sullivan, Paul K. Hurley, C. Leveugle et al. · Journal of Applied Physics · 2001 · 66 citations · Full text

Engineering, Materials Engineering, Materials Science +17

Examination of the Si(111)-SiO[sub 2], Si(110)-SiO[sub 2], and Si(100)-SiO[sub 2] Interfacial Properties Following Rapid Thermal Annealing

Paul K. Hurley, B. J. O’Sullivan, F.N. Cubaynes et al. · Journal of The Electrochemical Society · 2002 · 34 citations

Engineering, Materials Engineering, Materials Science +17

Effective work function modulation by controlled dielectric monolayer deposition

L. Pantisano, T. Schram, B. J. O’Sullivan et al. · Applied Physics Letters · 2006 · 31 citations

Engineering, Electrical Engineering, Materials Science +17