Tai-Chi Su

Transistor Mismatch Properties in Deep-Submicrometer CMOS Technologies

Xiaobin Yuan, Takashi Shimizu, U. Mahalingam et al. · IEEE Transactions on Electron Devices · 2011 · 48 citations

Engineering, Electrical Engineering, Microelectronics +16

Technology Scaling and Device Design for 350 GHz RF Performance in a 45nm Bulk CMOS Process

Hongmei Li, B. Jagannathan, Jing Wang et al. · 2007 · 47 citations

Engineering, Electrical Engineering, Microelectronics +16

Multiple layers of silicon-on-insulator islands fabrication by selective epitaxial growth

Sangwoo Pae, Tai-Chi Su, J.P. Denton et al. · IEEE Electron Device Letters · 1999 · 46 citations

Engineering, Electrical Engineering, Materials Science +17

Multiple layers of silicon-on-insulator for nanostructure devices

G.W. Neudeck, Sangwoo Pae, John P. Denton et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 1999 · 38 citations

Engineering, Electrical Engineering, Materials Science +17

Novel silicon epitaxy for advanced MOSFET devices

G.W. Neudeck, Tai-Chi Su, J.P. Denton · 2002 · 23 citations

Engineering, Electrical Engineering, Materials Science +17