Ming-Hung Han

Process-Variation Effect, Metal-Gate Work-Function Fluctuation, and Random-Dopant Fluctuation in Emerging CMOS Technologies

Yiming Li, Chih‐Hong Hwang, Tien-Yeh Li et al. · IEEE Transactions on Electron Devices · 2010 · 127 citations

Engineering, Computer Engineering, Electrical Engineering +17

Device and Circuit Performance Estimation of Junctionless Bulk FinFETs

Ming-Hung Han, Chun‐Yen Chang, Hung-Bin Chen et al. · IEEE Transactions on Electron Devices · 2013 · 89 citations

Engineering, Electrical Engineering, Microelectronics +16

Performance Comparison Between Bulk and SOI Junctionless Transistors

Ming-Hung Han, Chun-Yen Chang, Hung-Bin Chen et al. · IEEE Electron Device Letters · 2013 · 83 citations

Engineering, Electrical Engineering, Microelectronics +16

Characteristic of p-Type Junctionless Gate-All-Around Nanowire Transistor and Sensitivity Analysis

Ming-Hung Han, Chun‐Yen Chang, Yi‐Ruei Jhan et al. · IEEE Electron Device Letters · 2013 · 44 citations

Engineering, Electrical Engineering, Materials Science +17

3D device simulation of work function and interface trap fluctuations on high-κ / metal gate devices

Hui-Wen Cheng, Fuhai Li, Ming-Hung Han et al. · 2010 · 38 citations

Engineering, Electrical Engineering, Electronic Materials +16