Chih‐Hong Hwang - Concepedia

Author

Chih‐Hong Hwang

National Yang Ming Chiao Tung University

Also Known As

, C. H. Hwang, C. Hwang, C.-H. Hwang, C.H. Hwang, Chih-Hong Hwang, Chih‐Hong Hwang

Publications

555

Citations

H-Index

Concepts

All Affiliations

National Yang Ming Chiao Tung University National Institutes of Applied Research

About

Chih‐Hong Hwang is an author at National Yang Ming Chiao Tung University specializing in microelectronics, electrical engineering, and engineering.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	11	12	444
2	Electrical Engineering	11	11	408
3	Applied Physics	10	10	414
4	Computer Engineering	2	2	30
5	Materials Engineering	1	1	36

Chih‐Hong Hwang

Publications

507

Citations

H-Index

Page 1

	Year	Citations
Process-Variation Effect, Metal-Gate Work-Function Fluctuation, and Random-Dopant Fluctuation in Emerging CMOS Technologies Yiming Li, Chih‐Hong Hwang, Tien-Yeh Li, IEEE Transactions on Electron Devices Low-power ElectronicsDevice ModelingElectrical EngineeringRandom-dopant FluctuationGate Capacitance	2010	124
Random-Dopant-Induced Variability in Nano-CMOS Devices and Digital Circuits Yiming Li, Chih‐Hong Hwang, Tien-Yeh Li IEEE Transactions on Electron Devices Device ModelingElectrical EngineeringRandom-dopant-induced VariabilityTiming FluctuationsVlsi Design	2009	67
High-Frequency Characteristic Fluctuations of Nano-MOSFET Circuit Induced by Random Dopants Yiming Li, Chih‐Hong Hwang IEEE Transactions on Microwave Theory and Techniques Device ModelingElectrical EngineeringEngineeringPhysicsCircuit Design	2008	53
Effect of Fin Angle on Electrical Characteristics of Nanoscale Round-Top-Gate Bulk FinFETs Yiming Li, Chih‐Hong Hwang IEEE Transactions on Electron Devices Device ModelingElectrical CharacteristicsElectrical EngineeringEngineeringPhysics	2007	52
Microstructure of yttria-stabilized zirconia overcoats for thin film recording media A. S. Kao, Chih‐Hong Hwang Journal of Vacuum Science & Technology A Vacuum Surfaces and Films Materials ScienceMaterials EngineeringThermal Spray CoatingEngineeringMagnetic Data Storage	1990	36
Process-variation- and random-dopants-induced threshold voltage fluctuations in nanoscale planar MOSFET and bulk FinFET devices Yiming Li, Chih‐Hong Hwang, Hui-Wen Cheng Microelectronic Engineering Device ModelingElectrical EngineeringSemiconductor DeviceEngineeringNanotechnology	2008	27
Large‐scale “atomistic” approach to discrete‐dopant‐induced characteristic fluctuations in silicon nanowire transistors Yiming Li, Chih‐Hong Hwang, Hsuan‐Ming Huang physica status solidi (a)	2008	25
Electrical characteristic fluctuations in 16 nm bulk-FinFET devices Yiming Li, Chih‐Hong Hwang Microelectronic Engineering Device ModelingElectrical EngineeringEngineeringNanoelectronicsBias Temperature Instability	2007	19
Discrete-Dopant-Induced Timing Fluctuation and Suppression in Nanoscale CMOS Circuit Yiming Li, Chih‐Hong Hwang, Tien-Yeh Li IEEE Transactions on Circuits & Systems II Express Briefs Electrical EngineeringEngineeringVlsi DesignCircuit SystemNanoelectronics	2009	19
Large-scale atomistic approach to random-dopant-induced characteristic variability in nanoscale CMOS digital and high-frequency integrated circuits Yiming Li, Chih‐Hong Hwang, Ta‐Ching Yeh, International Conference on Computer Aided Design EngineeringDiscrete DopantsAnalog DesignRandom-dopant-induced Characteristic VariabilityIntegrated Circuits	2008	14

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