Valluri Rao

Novel optical probing technique for flip chip packaged microprocessors

Mario Paniccia, Travis M. Eiles, Valluri Rao et al. · 2002 · 57 citations

Engineering, Computer Engineering, Electrical Engineering +12

Metal contact reliability of RF MEMS switches

Qing Ma, Quan Tran, Tsung-Kuan A. Chou et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2007 · 55 citations

Engineering, Electrical Engineering, Materials Science +17

Dynamic Fault Imaging of VLSI Random Logic Devices

T.C. May, G. Scott, Eugene S. Meieran et al. · Reliability physics · 1984 · 51 citations

Engineering, Computer Engineering, Electrical Engineering +14

High-performance low-leakage enhancement-mode high-K dielectric GaN MOSHEMTs for energy-efficient, compact voltage regulators and RF power amplifiers for low-power mobile SoCs

Han Wui Then, L. A. Chow, Sandeepan DasGupta et al. · 2015 · 41 citations

Engineering, Electrical Engineering, Materials Science +14

Laser voltage probe (LVP): a novel optical probing technology for flip-chip packaged microprocessors

W.M. Yee, Mario Paniccia, Travis M. Eiles et al. · 1999 · 39 citations

Engineering, Computer Engineering, Electrical Engineering +17