Michael T. Postek

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Publications

Citations

3.4K

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Active since

1974

Affiliations

National Institute of Standards and Technology(Current)

Michael T. Postek is an author at National Institute of Standards and Technology specializing in electron microscopy, scanning electron microscopy, and materials science.

Publications per year

1974–2021

Publications

Modification of hydrogen-passivated silicon by a scanning tunneling microscope operating in air

John A. Dagata, J. Schneir, H. H. Harary et al. · Applied Physics Letters · 1990 · 733 citations · Full text

Natural Sciences, Materials Engineering, Materials Science +17

ELEMENTAL ANALYSIS OF DEPOSITS ON THE ROOTS OF SPARTINA ALTERNIFLORA LOISEL.

Irving A. Mendelssohn, Michael T. Postek · American Journal of Botany · 1982 · 177 citations

Agriculture, Botany, Plant Sciences +11

Experimental test of blind tip reconstruction for scanning probe microscopy

L.S. Dongmo, John S. Villarrubia, Samuel N. Jones et al. · Ultramicroscopy · 2000 · 138 citations

Natural Sciences, Biomedical Engineering, Biomedical Imaging +8

Development of the metrology and imaging of cellulose nanocrystals

Michael T. Postek, András Vládar, John A. Dagata et al. · Measurement Science and Technology · 2010 · 123 citations

Natural Sciences, Materials Engineering, Materials Science +12

Scanning-helium-ion-beam lithography with hydrogen silsesquioxane resist

Donny Winston, B. Cord, Bin Ming et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 2009 · 105 citations · Full text

Engineering, Materials Engineering, Materials Science +10

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