Bin Ming

Statistics

Publications

Citations

568

H-Index

Active since

2008

Affiliations

National Institute of Standards and Technology(Current)

Intel (United States)

Physical Measurement Laboratory

Bin Ming is an author at National Institute of Standards and Technology specializing in materials science, materials engineering, and natural sciences.

Publications per year

2008–2015

Publications

Development of the metrology and imaging of cellulose nanocrystals

Michael T. Postek, András Vládar, John A. Dagata et al. · Measurement Science and Technology · 2010 · 123 citations

Natural Sciences, Materials Engineering, Materials Science +12

Scanning electron microscope measurement of width and shape of 10 nm patterned lines using a JMONSEL-modeled library

John S. Villarrubia, András Vládar, Bin Ming et al. · Ultramicroscopy · 2015 · 114 citations · Full text

Natural Sciences, Materials Engineering, Materials Science +11

Scanning-helium-ion-beam lithography with hydrogen silsesquioxane resist

Donny Winston, B. Cord, Bin Ming et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 2009 · 105 citations · Full text

Engineering, Materials Engineering, Materials Science +10

Simulated SEM images for resolution measurement

Andrá E. Vladár, Bin Ming, Michael T. Postek · Scanning · 2008 · 48 citations

Natural Sciences, Materials Engineering, Materials Science +14

Review of current progress in nanometrology with the helium ion microscope

Michael T. Postek, András Vládar, Charles N. Archie et al. · Measurement Science and Technology · 2010 · 39 citations

Natural Sciences, Physics, Atomic Physics +11

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