Samuel N. Jones

Electrochemically assembled quasi-periodic quantum dot arrays

S. Bandyopadhyay, A. E. Miller, Hsueh‐Chia Chang et al. · Nanotechnology · 1996 · 159 citations

Natural Sciences, Materials Engineering, Materials Science +17

Experimental test of blind tip reconstruction for scanning probe microscopy

L.S. Dongmo, John S. Villarrubia, Samuel N. Jones et al. · Ultramicroscopy · 2000 · 138 citations

Natural Sciences, Biomedical Engineering, Biomedical Imaging +8

Image sharpness measurement in the scanning electron microscope—Part III

Nien Fan Zhang, Michael T. Postek, Robert D. Larrabee et al. · Scanning · 1999 · 56 citations

Arts, Materials Engineering, Digital Imaging +15

Intercomparison of SEM, AFM, and electrical linewidths

John S. Villarrubia, Ronald G. Dixson, Samuel N. Jones et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 1999 · 33 citations

Engineering, Electrical Engineering, Instrumentation +16

Interalaboratory study on the lithographically produced scanning electron microscope magnification standard prototype

Michael T. Postek, AE Vladár, Samuel N. Jones et al. · Journal of Research of the National Institute of Standards and Technology · 1993 · 32 citations · Full text

Engineering, Materials Engineering, Materials Science +17