Statistics
Publications
6
Citations
427
H-Index
6
Active since
1993
Affiliations
Samuel N. Jones is an author at National Institute of Standards and Technology specializing in microscopy, applied physics, and engineering.
Publications per year
1993–2000
6
6
Image sharpness measurement in the scanning electron microscope—Part III
Nien Fan Zhang, Michael T. Postek, Robert D. Larrabee et al. · Scanning · 1999 · 55 citations
Engineering, Microscopy, Measurement +21
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