27
Publications
2.8K
Citations
21
H-Index
1984
Active since
J. Schneir is an author at National Institute of Standards and Technology specializing in engineering, applied physics, and microscopy.
Top concepts
EngineeringMicroscopyApplied PhysicsMaterial ScienceSurface SciencePhysicsNanotechnologyMicrofabricationMedicineBiophysics
Publications per year
1984–2007
27
27
Spatial Distribution Maps for Atom Probe Tomography
B. Geiser, Thomas F. Kelly, David J. Larson et al. · Microscopy and Microanalysis · 2007 · 188 citations
Scanning Tunneling Microscopy of Freeze-Fracture Replicas of Biomembranes
Joseph A. Zasadzinski, J. Schneir, John Gurley et al. · Science · 1988 · 168 citations
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