Statistics
Publications
12
Citations
353
H-Index
10
Active since
1961
R. Solomon is an author at Intel (United States) specializing in engineering, electrical engineering, and semiconductor devices.
Publications per year
1961–2002
12
12
A CV technique for measuring thin SOI film thickness
J. Chen, R. Solomon, T.Y. Chan et al. · IEEE Electron Device Letters · 1991 · 69 citations
STIMULATED EMISSION AT 5985 Å FROM Pr+3 IN LaF3
R. Solomon · Applied Physics Letters · 1963 · 52 citations
R. Solomon, A. Sher, Michael Müller · Journal of Applied Physics · 1966 · 36 citations
Noise overshoot at drain current kink in SOI MOSFET
J. Chen, Peng Fang, P.K. Ko et al. · 2002 · 27 citations
Engineering, Electrical Engineering, Electronic Materials +16
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