Concepedia

R. Solomon

RS

Statistics

Publications

12

Citations

353

H-Index

10

Active since

1961

Affiliations

Intel (United States)(Current)

University of California, Berkeley

Varian Medical Systems (United States)

Cypress Semiconductor Corporation (United States)

R. Solomon is an author at Intel (United States) specializing in applied physics, electrical engineering, and engineering.

Top concepts

EngineeringApplied PhysicsElectrical EngineeringMicroelectronicsMaterial SciencePhysicsThin FilmsIntegrated CircuitsSingle Event EffectsSemiconductors

Publications per year

1961–2002

12

Publications

12

A CV technique for measuring thin SOI film thickness

J. Chen, R. Solomon, T.Y. Chan et al. · IEEE Electron Device Letters · 1991 · 69 citations

Engineering, Cv Measurements, Silicon On Insulator +16

STIMULATED EMISSION AT 5985 Å FROM Pr+3 IN LaF3

R. Solomon, Leonard Mueller · Applied Physics Letters · 1963 · 52 citations

Optical Pumping, Humanities, History Of Science +14

Threshold voltage and C-V characteristics of SOI MOSFET's related to Si film thickness variation on SIMOX wafers

J. Chen, R. Solomon, T.Y. Chan et al. · IEEE Transactions on Electron Devices · 1992 · 50 citations

Electrical Engineering, Engineering, Simox Wafers +14

Polarization in LaF3

R. Solomon, A. Sher, Michael Müller · Journal of Applied Physics · 1966 · 36 citations

Materials Science, Ionic Surface States, Solid-state Ionic +12

Noise overshoot at drain current kink in SOI MOSFET

J. Chen, Peng Fang, P.K. Ko et al. · 2002 · 27 citations

Electrical Engineering, Noise Peak, Engineering +11

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