Statistics
Publications
1
Citations
69
H-Index
1
Active since
1991
Affiliations
J. Chen is an author at Cypress Semiconductor Corporation (United States) specializing in silicon wafers, thin films, and device characterization.
Publications per year
1991–1991
1
1
A CV technique for measuring thin SOI film thickness
J. Chen, R. Solomon, T.Y. Chan et al. · IEEE Electron Device Letters · 1991 · 69 citations
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