J. Zweck

Transmission electron microscopy and reflected high-energy electron-diffraction investigation of plastic relaxation in doped and undoped ZnSe/GaAs(001)

Andreas Rosenauer, Thomas Reisinger, Fernando Franzén et al. · Journal of Applied Physics · 1996 · 31 citations

Natural Sciences, Materials Science, Physics +17

Investigation of surface amorphization of silicon wafers during ion-milling

T. Schuhrke, M. Mändl, J. Zweck et al. · Ultramicroscopy · 1992 · 27 citations

Engineering, Materials Engineering, Materials Science +14

Highly efficient light emission from stacking faults intersecting nonpolar GaInN quantum wells

H. Jönen, U. Rossów, H. Bremers et al. · Applied Physics Letters · 2011 · 26 citations

Engineering, Materials Engineering, Materials Science +17

Correlation of strain, wing tilt, dislocation density, and photoluminescence in epitaxial lateral overgrown GaN on SiC substrates

N. Gmeinwieser, Karl Engl, P. Gottfriedsen et al. · Journal of Applied Physics · 2004 · 26 citations

Engineering, Materials Engineering, Materials Science +17

Analysis of indium incorporation in non- and semipolar GaInN QW structures: comparing x-ray diffraction and optical properties

H. Jönen, H. Bremers, U. Rossów et al. · Semiconductor Science and Technology · 2012 · 18 citations

Engineering, Materials Science, Physics +17