Monique Ercken

Line edge roughness: characterization, modeling and impact on device behavior

J.A. Croon, Gert Storms, Stephanie Winkelmeier et al. · 2003 · 107 citations

Engineering, Electrical Engineering, Electronic Materials +16

Study of Solvent Diffusion in Polymeric Materials Using Magnetic Resonance Imaging

Monique Ercken, Peter Adriaensens, Dirk Vanderzande et al. · Macromolecules · 1995 · 49 citations

Natural Sciences, Chemistry, Materials Science +17

(Invited) Vertical Nanowire FET Integration and Device Aspects

A. Veloso, Efrain Altamirano Sánchez, S. Brus et al. · ECS Transactions · 2016 · 49 citations

Engineering, Computer Engineering, Electrical Engineering +17

Junctionless gate-all-around lateral and vertical nanowire FETs with simplified processing for advanced logic and analog/RF applications and scaled SRAM cells

A. Veloso, Bertrand Parvais, Philippe Matagne et al. · 2016 · 37 citations

Engineering, Electrical Engineering, Materials Science +17

Use of Magnetic Resonance Imaging To Study Transport of Methanol in Poly(methyl methacrylate) at Variable Temperature

Monique Ercken, Peter Adriaensens, G. Reggers et al. · Macromolecules · 1996 · 35 citations

Natural Sciences, Chemistry, Materials Science +17