John Rodriguez

Impact of negative bias temperature instability on digital circuit reliability

Vijay Reddy, Anand Krishnan, Andrew Marshall et al. · Microelectronics Reliability · 2004 · 119 citations

Reliability, Electrical Engineering, Reliability Engineering +10

An FRAM-Based Nonvolatile Logic MCU SoC Exhibiting 100% Digital State Retention at <formula formulatype="inline"> <tex Notation="TeX">${\rm VDD}=$</tex></formula> 0 V Achieving Zero Leakage With <formula formulatype="inline"><tex Notation="TeX">${<}$</tex> </formula>400-ns Wakeup Time for ULP Applications

Sudhanshu Khanna, Steven Bartling, M.A. Clinton et al. · IEEE Journal of Solid-State Circuits · 2013 · 65 citations

Non-volatile Memory, Engineering, Vlsi Design +20

An implantable 64-channel neural interface with reconfigurable recording and stimulation

Jesse Wheeler, Keith Baldwin, Alex Kindle et al. · 2015 · 22 citations

Medical Electronics, Engineering, Neural Recoding +30

Observation and Control of Hot Atom Damage in Ferroelectric Devices

Muhammad Masuduzzaman, Dhanoop Varghese, John Rodriguez et al. · IEEE Transactions on Electron Devices · 2014 · 21 citations

Engineering, Device Lifetime, Defect Tolerance +21

Viable Stem Cells Are in the Injury Effusion Fluid and Arthroscopic Byproducts From Knee Cruciate Ligament Surgery: An In Vivo Analysis

Adam W. Anz, Eric A. Branch, John Rodriguez et al. · Arthroscopy The Journal of Arthroscopic and Related Surgery · 2016 · 12 citations

Regenerative Medicine, Tissue Engineering, Injury Effusion Fluid +14