Saibal Mukhopadhyay

Device-Optimization Technique for Robust and Low-Power FinFET SRAM Design in NanoScale Era

Aditya Bansal, Saibal Mukhopadhyay, Kaushik Roy · IEEE Transactions on Electron Devices · 2007 · 94 citations

Low-power Electronics, Hardware Security, Electrical Engineering +13

Improving IC Security Against Trojan Attacks Through Integration of Security Monitors

Seetharam Narasimhan, Wen Yueh, Xinmu Wang et al. · IEEE Design & Test of Computers · 2012 · 64 citations

Hardware Security, Hardware Trojan, Engineering +15

Leakage in nano-scale technologies

Amit Agarwal, Chris H. Kim, Saibal Mukhopadhyay et al. · 2004 · 63 citations

Leakage Spread, Engineering, Vlsi Design +19

Pre-Bond and Post-Bond Test and Signal Recovery Structure to Characterize and Repair TSV Defect Induced Signal Degradation in 3-D System

Minki Cho, Chang Liu, Dae Hyun Kim et al. · IEEE Transactions on Components Packaging and Manufacturing Technology · 2011 · 59 citations

Signal Recovery Structure, Electrical Engineering, 3D Ic Architecture +15

A forward body-biased low-leakage SRAM cache

Chris H. Kim, Jae‐Joon Kim, Saibal Mukhopadhyay et al. · 2003 · 53 citations

Hardware Security, Non-volatile Memory, Electrical Engineering +13