Concepedia

Yoshikazu Ohno

YO

Statistics

Publications

5

Citations

104

H-Index

5

Active since

1982

Affiliations

The University of Osaka(Current)

Mitsubishi Electric (Japan)

Mitsubishi Electric (Germany)

Yoshikazu Ohno is an author at The University of Osaka specializing in engineering, device reliability, and semiconductor devices.

Publications per year

1982–1998

5

Publications

5

Impact of Organic Contaminants from the Environment on Electrical Characteristics of Thin Gate Oxides

Tamotsu Ogata, Cozy BAN, Akemi Ueyama et al. · Japanese Journal of Applied Physics · 1998 · 46 citations

Engineering, Electrical Engineering, Materials Science +17

Charge Collection Control Using Retrograde Well Tested by Proton Microprobe Irradiation

H. Sayama, Hiroshi Kimura, Yoshikazu Ohno et al. · Japanese Journal of Applied Physics · 1993 · 17 citations

Engineering, Electrical Engineering, Fault-tolerant Computing +14

Diamond-Anvil Cell Equipped with a Worm Gear Intensifier for Pressure Generation at Low Temperature

Shoichi Endo, Osamu Mishima, Yoshikazu Ohno et al. · Japanese Journal of Applied Physics · 1982 · 17 citations

Engineering, Materials Engineering, Materials Science +10

New Method for Soft-Error Mapping in Dynamic Random Access Memory Using Nuclear Microprobe

H. Sayama, S. Hara, Hiroshi Kimura et al. · Japanese Journal of Applied Physics · 1992 · 14 citations

Engineering, Computer Engineering, Fault Tolerance +14

Highly Reliable SiO<sub>2</sub> Films Formed by UV-O<sub>2</sub> Oxidation

Akinobu Teramoto, K. Kobayashi, Yoshikazu Ohno et al. · Japanese Journal of Applied Physics · 1998 · 10 citations

Engineering, Materials Engineering, Materials Science +17

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