S-J. Wen

Neutron- and Proton-Induced Single Event Upsets for D- and DICE-Flip/Flop Designs at a 40 nm Technology Node

T. D. Loveless, S. Jagannathan, Trey Reece et al. · IEEE Transactions on Nuclear Science · 2011 · 123 citations

Engineering, Dice Designs, Neutron Scattering +16

Technology Scaling Comparison of Flip-Flop Heavy-Ion Single-Event Upset Cross Sections

N. J. Gaspard, S. Jagannathan, Z. J. Diggins et al. · IEEE Transactions on Nuclear Science · 2013 · 52 citations

Engineering, Vlsi Design, Nuclear Physics +17

Temperature dependence of soft error rate in flip-flop designs

S. Jagannathan, Z. J. Diggins, N. N. Mahatme et al. · 2012 · 24 citations

Engineering, Vlsi Design, Temperature Dependence +18

Neutron- and alpha-particle induced soft-error rates for flip flops at a 40 nm technology node

S. Jagannathan, T. D. Loveless, Z. J. Diggins et al. · 2011 · 16 citations

Soft-error Rates, Engineering, Flip-flop Designs +18