Ming-Yin Hao

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Publications

Citations

103

H-Index

Active since

1994

Affiliations

Advanced Micro Devices (United States)(Current)

The University of Texas at Austin

Ming-Yin Hao is an author at Advanced Micro Devices (United States) specializing in semiconductor reliability, materials science, and semiconductor devices.

Publications per year

1994–2003

Publications

Oxide reliability of drain engineered I/O NMOS from hot carrier injection

Yuhao Luo, Deepak Kumar Nayak, Daniel Gitlin et al. · IEEE Electron Device Letters · 2003 · 21 citations

Engineering, Electrical Engineering, Aging +16

Impact of boron penetration at P/sup +/-poly/gate oxide interface on deep-submicron device reliability for dual-gate CMOS technologies

Ming-Yin Hao, Deepak Kumar Nayak, R. Rakkit · IEEE Electron Device Letters · 1997 · 20 citations

Engineering, Electrical Engineering, Materials Science +17

Novel process for reliable ultrathin tunnel dielectrics

Ming-Yin Hao, B. Maiti, Jack C. Lee · Applied Physics Letters · 1994 · 16 citations

Engineering, Materials Engineering, Materials Science +16

Gate quality ultrathin (2.5 nm) PECVD deposited oxynitride and nitrided oxide dielectrics

E. Ibok, Khaled Ahmed, Ming-Yin Hao et al. · IEEE Electron Device Letters · 1999 · 16 citations

Natural Sciences, Electrical Engineering, Materials Science +17

‘‘Turn-around’’ effects of stress-induced leakage current of ultrathin N2O-annealed oxides

Kafai Lai, Wei-Ming Chen, Ming-Yin Hao et al. · Applied Physics Letters · 1995 · 15 citations

Natural Sciences, Materials Engineering, Materials Science +17

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