E. Ibok

15 nm gate length planar CMOS transistor

Bin Yu, Haihong Wang, Aditya Joshi et al. · 2002 · 90 citations

Engineering, Computer Engineering, Electrical Engineering +14

Temperature-programmed desorption from porous catalysts: Shape index analysis

E. Ibok · Journal of Catalysis · 1980 · 59 citations

Natural Sciences, Chemical Engineering, Chemistry +16

A Characterization of the Effect of Deposition Temperature on Polysilicon Properties: Morphology, Dopability, Etchability, and Polycide Properties

E. Ibok, S. Garg · Journal of The Electrochemical Society · 1993 · 55 citations

Natural Sciences, Materials Engineering, Materials Science +17

Impact of tunnel currents and channel resistance on the characterization of channel inversion layer charge and polysilicon-gate depletion of sub-20-Å gate oxide MOSFETs

Khaled Ahmed, E. Ibok, G.C.-F. Yeap et al. · IEEE Transactions on Electron Devices · 1999 · 43 citations

Engineering, Electrical Engineering, Microelectronics +16

Comparative physical and electrical metrology of ultrathin oxides in the 6 to 1.5 nm regime

Khaled Ahmed, E. Ibok, Gurjeet S. Bains et al. · IEEE Transactions on Electron Devices · 2000 · 29 citations

Engineering, Electrical Engineering, Materials Science +17