Statistics
Publications
5
Citations
135
H-Index
5
Active since
1992
J.T. Yue is an author at University of California, Berkeley specializing in engineering, microelectronics, and electrical engineering.
Publications per year
1992–2024
5
5
Simulations of CMOS circuit degradation due to hot-carrier effects
K.N. Quader, P.K. Ko, Chenming Hu et al. · 1992 · 30 citations
Engineering, Computer Engineering, Electrical Engineering +17
Applying dynamic voltage stressing to reduce early failure rate
C.P. Tsao, R.Y. Shiue, Chen-Ching Ting et al. · 2002 · 12 citations
Engineering, Computer Engineering, Electrical Engineering +14
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