J.R. Shih

Self-heating effect in FinFETs and its impact on devices reliability characterization

S. E. Liu, J. S. Wang, Ying-Ta Lu et al. · 2014 · 114 citations

Engineering, Electrical Engineering, Electronic Materials +15

Novel ESD protection structure with embedded SCR LDMOS for smart power technology

Jian-Hsing Lee, J.R. Shih, Chin-Hsin Tang et al. · 2003 · 42 citations

Engineering, Electrical Engineering, Microelectronics +7

An Investigation on Anomalous Hot-Carrier-Induced On-Resistance Reduction in n-Type LDMOS Transistors

J.F. Chen, Kuen-Shiuan Tian, Shiang-Yu Chen et al. · IEEE Transactions on Device and Materials Reliability · 2009 · 29 citations

Engineering, Electrical Engineering, Microelectronics +16

The Influence of NBL Layout and LOCOS Space on Component ESD and System Level ESD for HV-LDMOS

Jian‐Hsing Lee, S.H. Chen, Yu‐Ting Tsai et al. · 2007 · 27 citations

Engineering, Electrical Engineering, Low-power Design +9

Effects of gate bias on hot-carrier reliability in drain extended metal-oxide-semiconductor transistors

Kehuey Wu, J. F. Chen, Yan‐Kuin Su et al. · Applied Physics Letters · 2006 · 22 citations

Engineering, Electrical Engineering, Microelectronics +16