Kehuey Wu

Novel read disturb failure mechanism induced by FLASH cycling

Adam Brand, Kehuey Wu, Shijie Pan et al. · 1993 · 87 citations

Engineering, Low Failure Rate, Reliability Engineering +16

Stacked Ge-Nanosheet GAAFETs Fabricated by Ge/Si Multilayer Epitaxy

Chun-Lin Chu, Kehuey Wu, Guang-Li Luo et al. · IEEE Electron Device Letters · 2018 · 80 citations

Semiconductors, Semiconductor Technology, Electrical Engineering +12

Thermal behavior of self-heating effect in FinFET devices acting on back-end interconnects

C. W. Chang, S. E. Liu, B. L. Lin et al. · 2015 · 39 citations

Engineering, Mechanical Engineering, Interconnect (Integrated Circuits) +18

Effects of gate bias on hot-carrier reliability in drain extended metal-oxide-semiconductor transistors

Kehuey Wu, J. F. Chen, Yan‐Kuin Su et al. · Applied Physics Letters · 2006 · 22 citations

Electrical Engineering, Semiconductor Device, Engineering +13

The Observation of Width Quantization Impact on Device Performance and Reliability for High-k/Metal Tri-Gate FinFET

Wen‐Kuan Yeh, Wenqi Zhang, Yi-Lin Yang et al. · IEEE Transactions on Device and Materials Reliability · 2016 · 15 citations

Width Quantization Impact, Semiconductor Technology, Electrical Engineering +14