K.N. Quader

Berkeley reliability tools-BERT

R. Tu, Elyse Rosenbaum, Wayne Chan et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 1993 · 196 citations

Software Maintenance, Software Reliability Testing, Engineering +25

A 130.7mm<sup>2</sup> 2-layer 32Gb ReRAM memory device in 24nm technology

Tz-yi Liu, Tian Hong Yan, R.E. Scheuerlein et al. · 2013 · 116 citations

Hardware Security, Non-volatile Memory, Electrical Engineering +13

A 34 MB/s MLC Write Throughput 16 Gb NAND With All Bit Line Architecture on 56 nm Technology

Raul-Adrian Cernea, Long Pham, Farookh Moogat et al. · IEEE Journal of Solid-State Circuits · 2009 · 75 citations

NAND Flash Memory: Challenges and Opportunities

Yan Li, K.N. Quader · Computer · 2013 · 67 citations

Non-volatile Memory, Electrical Engineering, Sub-20 Nm +12

A 16 Gb 3-Bit Per Cell (X3) NAND Flash Memory on 56 nm Technology With 8 MB/s Write Rate

Yan Li, Seungpil Lee, Yupin Fong et al. · IEEE Journal of Solid-State Circuits · 2009 · 53 citations

Nm Technology, Electrical Engineering, Non-volatile Memory +12