Statistics
Publications
45
Citations
2.4K
H-Index
26
Active since
2006
Jay Im is an author at The University of Texas at Austin specializing in engineering, electrical engineering, and materials science.
Publications per year
2006–2023
45
45
Thermo-mechanical reliability of 3-D ICs containing through silicon vias
Kuan Lu, Xuefeng Zhang, Suk-Kyu Ryu et al. · 2009 · 208 citations
Engineering, Computer Engineering, Electrical Engineering +17
Thermal stress induced delamination of through silicon vias in 3-D interconnects
Kuan Lu, Suk-Kyu Ryu, Qiu Zhao et al. · 2010 · 125 citations
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