Anshul Gupta

Modeling of Effective Thermal Resistance in Sub-14-nm Stacked Nanowire and FinFETs

Ishita Jain, Anshul Gupta, Terence B. Hook et al. · IEEE Transactions on Electron Devices · 2018 · 55 citations

Engineering, Thermal Conductivity, Effective Thermal Resistance +23

Reliability Modeling and Analysis of Hot-Carrier Degradation in Multiple-Fin SOI n-Channel FinFETs With Self-Heating

Anshul Gupta, Charu Gupta, Reinaldo A. Vega et al. · IEEE Transactions on Electron Devices · 2019 · 39 citations

Electrical Engineering, Hot-carrier Degradation, Engineering +13

3-D LER and RDF Matching Performance of Nanowire FETs in Inversion, Accumulation, and Junctionless Modes

Anil K. Bansal, Charu Gupta, Anshul Gupta et al. · IEEE Transactions on Electron Devices · 2018 · 36 citations

Nanowire Field-effect Transistors, Junctionless Modes, Engineering +22

Investigation of Hot-Carrier Degradation in 0.18-$\mu$ m MOSFETs for the Evaluation of Device Lifetime and Digital Circuit Performance

Anshul Gupta, Charu Gupta, H. S. Jatana et al. · IEEE Transactions on Device and Materials Reliability · 2019 · 33 citations

Electrical Engineering, Hot-carrier Degradation, Engineering +12

Single Event Transients in Sub-10nm SOI MuGFETs Due to Heavy-Ion Irradiation

Chandan Kumar Jha, Kritika Aditya, Charu Gupta et al. · IEEE Transactions on Device and Materials Reliability · 2020 · 19 citations

Device Modeling, Electrical Engineering, Single Event Transients +14