Charu Gupta

Reliability Modeling and Analysis of Hot-Carrier Degradation in Multiple-Fin SOI n-Channel FinFETs With Self-Heating

Anshul Gupta, Charu Gupta, Reinaldo A. Vega et al. · IEEE Transactions on Electron Devices · 2019 · 40 citations

Engineering, Electrical Engineering, Electronic Materials +16

Investigation of Hot-Carrier Degradation in 0.18-$\mu$ m MOSFETs for the Evaluation of Device Lifetime and Digital Circuit Performance

Anshul Gupta, Charu Gupta, H. S. Jatana et al. · IEEE Transactions on Device and Materials Reliability · 2019 · 37 citations

Engineering, Electrical Engineering, Aging +15

3-D LER and RDF Matching Performance of Nanowire FETs in Inversion, Accumulation, and Junctionless Modes

Anil K. Bansal, Charu Gupta, Anshul Gupta et al. · IEEE Transactions on Electron Devices · 2018 · 36 citations

Engineering, Electrical Engineering, Microelectronics +16

Series Resistance Reduction With Linearity Assessment for Vertically Stacked Junctionless Accumulation Mode Nanowire FET

Anil K. Bansal, Manoj Kumar, Charu Gupta et al. · IEEE Transactions on Electron Devices · 2018 · 26 citations

Engineering, Electrical Engineering, Materials Science +17

Single Event Transients in Sub-10nm SOI MuGFETs Due to Heavy-Ion Irradiation

Chandan Kumar Jha, Kritika Aditya, Charu Gupta et al. · IEEE Transactions on Device and Materials Reliability · 2020 · 21 citations

Engineering, Computer Engineering, Electrical Engineering +17