Hao Wu

Smart GaN platform: Performance & challenges

Chun-Lin Tsai, Yun-Hsiang Wang, Man Ho Kwan et al. · 2017 · 82 citations

Engineering, Energy Efficiency, Gan Power Devices +16

Total Ionizing Dose and Annealing Effects on Shift for p-GaN Gate AlGaN/GaN HEMTs<i/> <sub/>

Hao Wu, Xiaojun Fu, Jingwei Guo et al. · IEEE Electron Device Letters · 2022 · 29 citations

A New 4H-SiC Trench MOSFET With Improved Reverse Conduction, Breakdown, and Switching Characteristics

Jingwei Guo, Ping Li, Jie Jiang et al. · IEEE Transactions on Electron Devices · 2022 · 28 citations

Sic Mosfet, Electrical Engineering, Engineering +10

Time-Resolved Threshold Voltage Instability of 650-V Schottky Type p-GaN Gate HEMT Under Temperature-Dependent Forward and Reverse Gate Bias Conditions

Hao Wu, Fu Xiaojun, Jingwei Guo et al. · IEEE Transactions on Electron Devices · 2022 · 25 citations

Wide-bandgap Semiconductor, Electrical Engineering, Engineering +9

Enhancement of Breakdown Voltage in p-GaN Gate AlGaN/GaN HEMTs With a Stepped Hybrid GaN/AlN Buffer Layer

Yuan Wang, Shengdong Hu, Jingwei Guo et al. · IEEE Journal of the Electron Devices Society · 2022 · 23 citations · Full text

Wide-bandgap Semiconductor, Electrical Engineering, Engineering +9