D.M. Erb

Stress modeling of Cu/low-k BEoL - application to stress migration

C.J. Zhai, Heng Yao, P.R. Besser et al. · 2004 · 29 citations

Engineering, Mechanical Engineering, Residual Stress +23

Electron gate currents and threshold stability in the n-channel stacked gate MOS tetrode

D.M. Erb, H.G. Dill, T.N. Toombs · IEEE Transactions on Electron Devices · 1971 · 18 citations

Semiconductors, Semiconductor Technology, Electrical Engineering +14

Stratified charge memory

D.M. Erb · 1978 · 16 citations

Engineering, Stratified Charge Memory, Electronic Memory +4

A 64-kbit block addressed charge-coupled memory

A.M. Mohsen, R.W. Bower, E.M. Wilder et al. · IEEE Journal of Solid-State Circuits · 1976 · 14 citations

Non-volatile Memory, Electrical Engineering, Engineering +11

Binary Cu-alloy layers for Cu-interconnections reliability improvement

C.P. Wang, Sergey Lopatin, Amit P. Marathe et al. · 2001 · 14 citations

Engineering, Chemical Deposition, Cu Seed Integrity +17