L. Wilde

Ferroelectricity in yttrium-doped hafnium oxide

Johannes Müller, U. Schröder, T. S. Böscke et al. · Journal of Applied Physics · 2011 · 669 citations

Materials Science, Oxide Heterostructures, Electrical Engineering +13

Role of the dielectric for the charging dynamics of the dielectric/barrier interface in AlGaN/GaN based metal-insulator-semiconductor structures under forward gate bias stress

P. Lagger, P. Steinschifter, Maria Reiner et al. · Applied Physics Letters · 2014 · 66 citations

Semiconductors, High Density, Electrical Engineering +14

High-resolution XPS and NEXAFS study of SO2 adsorption on Pt(111): two surface SO2 species

M. Polčík, L. Wilde, J. Haase et al. · Surface Science · 1997 · 66 citations

Materials Science, Inorganic Chemistry, Engineering +12

Impact of interface variations on J–V and C–V polarity asymmetry of MIM capacitors with amorphous and crystalline Zr(1−)Al O2 films

Wenke Weinreich, R. Reiche, M. Lemberger et al. · Microelectronic Engineering · 2009 · 63 citations

Materials Science, C–v Polarity Asymmetry, Material Analysis +9

Structural properties of as deposited and annealed ZrO2 influenced by atomic layer deposition, substrate, and doping

Wenke Weinreich, L. Wilde, Johannes Müller et al. · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 2012 · 55 citations

Engineering, Annealed Zro2, Chemical Deposition +19