Kirk Prall

19.7 A 16Gb ReRAM with 200MB/s write and 1GB/s read in 27nm technology

R. Fackenthal, Makoto Kitagawa, Wataru Otsuka et al. · 2014 · 212 citations

Hardware Security, High Density, Electrical Engineering +15

Scaling Non-Volatile Memory Below 30nm

Kirk Prall · 2007 · 132 citations

Hardware Security, Non-volatile Memories, Electrical Engineering +13

25nm 64Gb MLC NAND technology and scaling challenges invited paper

Kirk Prall, Krishna Parat · 2010 · 54 citations

Electrical Engineering, Nand Technology, Engineering +13

Process integration of a 27nm, 16Gb Cu ReRAM

J. Zahurak, Koji Miyata, Mark H. Fischer et al. · 2014 · 54 citations

Materials Science, Electrical Engineering, Wafer Scale Processing +13

Characterization and suppression of drain coupling in submicrometer EPROM cells

Kirk Prall, Wayne Kinney, J. Macro · IEEE Transactions on Electron Devices · 1987 · 35 citations

Device Modeling, Device Design Techiques, Electrical Engineering +13