Changze Liu

New insights into the hot carrier degradation (HCD) in FinFET: New observations, unified compact model, and impacts on circuit reliability

Zhuoqing Yu, Jiayang Zhang, Runsheng Wang et al. · 2017 · 73 citations

Engineering, Electrical Engineering, Analog Electronics +16

Hot carrier reliability characterization in consideration of self-heating in FinFET technology

Minjung Jin, Changze Liu, Jinju Kim et al. · 2016 · 71 citations

Engineering, Electrical Engineering, Heat Transfer +15

Systematical study of 14nm FinFET reliability: From device level stress to product HTOL

Changze Liu, Hyun Chul Sagong, Hyejin Kim et al. · 2015 · 45 citations

Engineering, Computer Engineering, Electrical Engineering +17

New insights into AC RTN in scaled high-к / metal-gate MOSFETs under digital circuit operations

Jibin Zou, Runsheng Wang, Nanbo Gong et al. · 2012 · 32 citations

Engineering, Computer Engineering, Electrical Engineering +17

A unified approach for trap-aware device/circuit co-design in nanoscale CMOS technology

Runsheng Wang, Mulong Luo, Shaofeng Guo et al. · 2013 · 31 citations

Engineering, Computer Engineering, Electrical Engineering +17