Shaofeng Guo

Impacts of Random Telegraph Noise (RTN) on Digital Circuits

Mulong Luo, Runsheng Wang, Shaofeng Guo et al. · IEEE Transactions on Electron Devices · 2014 · 73 citations

Engineering, Computer Engineering, Electrical Engineering +16

New insights into the hot carrier degradation (HCD) in FinFET: New observations, unified compact model, and impacts on circuit reliability

Zhuoqing Yu, Jiayang Zhang, Runsheng Wang et al. · 2017 · 73 citations

Engineering, Electrical Engineering, Analog Electronics +16

Comparative study of turbulence models on highly constricted plasma cutting arc

Qianhong Zhou, Hui Li, Xu Xu et al. · Journal of Physics D Applied Physics · 2008 · 46 citations

Natural Sciences, Physics, Fluid Dynamics +16

Extraction of Process Variation Parameters in FinFET Technology Based on Compact Modeling and Characterization

Zhe Zhang, Xiaobo Jiang, Runsheng Wang et al. · IEEE Transactions on Electron Devices · 2018 · 43 citations

Engineering, Computer Engineering, Electrical Engineering +17

The effect of plasma-gas swirl flow on a highly constricted plasma cutting arc

Qianhong Zhou, Huiting Yin, Hui Li et al. · Journal of Physics D Applied Physics · 2009 · 37 citations

Natural Sciences, Physics, Flow Visualization +15